Jeong-Tae Kim Professor
Electronic and Electrical Engineering/Semiconductor Engineering/
Professor Kim, Jeongtae is a full professor in the Department of Electronics Engineering in the Ewha Womans University. He is actively doing research on image signal processing. He received his B.S. and M.S degree in Control and Instrumentation Engineering from the Seoul National University ,Seoul, Korea, and his Ph. D. degree in Electrical engineering and Computer Science from the University of Michigan, Ann Arbor, USA. From 1991 to 1998, he had worked for Samsung Electronics where he had been engaged in the development of digital systems such as digital TV and home network system. Since Mar. 2004, he has been with the Department of Electronics Engineering in the Ewha Womens University , currently as a full professor. He has published research articles in prominent international journals by conducting research on statistical signal processing, medical image processing, microscopy image restoration, signal processing for CMOS image sensor, computational photography and image processing for light field camera, etc.
- Dean, The ELTEC College of Engineering/Dean, The College of Engineering/Director, Center for Innovation in Engineering Education
- Asan Engineering Building #529
- 02-3277-4084
- Office hours
- 화 2-4시, 목 5-7시
Research Record
- Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules IEEE ACCESS, 2023, v.11, 66017-66027
- Spatial and Channel-Wise Co-Attention-Based Twin Network System for Inspecting Integrated Circuit Substrate IEEE Transactions on Semiconductor Manufacturing, 2023, v.36 no.3, 434-444
- Robust Change Detection Using Channel-Wise co-Attention-Based Siamese Network With Contrastive Loss Function IEEE ACCESS, 2022, v.10, 45365-45374
- Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions International Journal of Precision Engineering and Manufacturing, 2020, v.21 no.4, 0
- Image Reconstruction of Moving Objects Using Multiple IR-UWB Radar Signals IEEE Sensors Journal, 2019, v.19 no.20, 9402-9410
- Joint Banknote Recognition and Counterfeit Detection Using Explainable Artificial Intelligence SENSORS, 2019, v.19 no.16, 3607
- Machine Learning-Based Fast Banknote Serial Number Recognition Using Knowledge Distillation and Bayesian Optimization SENSORS, 2019, v.19 no.19, 4218
- Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices ELECTRONICS, 2019, v.8 no.5, 533
- A comparative study of transfer learning-based methods for inspection of mobile camera modules IEIE Transactions on Smart Processing and Computing, 2018, v.7 no.1, 70-74
- Fast computation of projection image based on the repeated patterns of intersection between ray and voxel Transactions of the Korean Institute of Electrical Engineers, 2017, v.66 no.6, 942-948
- Depth-based refocusing for reducing directional aliasing artifacts OPTICS EXPRESS, 2016, v.24 no.24, 28065-28079
- Parametric Blind Restoration of Bi-level Images with Unknown Intensities IEIE Transactions on Smart Processing & Computing, 2016, v.5 no.5, 319
- Alternating minimization of the negative Poisson likelihood function for the global analysis of fluorescence lifetime imaging microscopy data OPTICS EXPRESS, 2014, v.22 no.21, 24977-24987
- [학술지논문] Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules IEEE ACCESS, 2023, v.11 no.1 , 66017-66027
- [학술지논문] Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2020, v.21 no.4 , 747-758
- [학술지논문] Image Reconstruction of Moving Objects Using Multiple IR-UWB Radar Signals IEEE SENSORS JOURNAL, 2019, v.19 no.20 , 9402-9410
- [학술지논문] Machine Learning-Based Fast Banknote Serial Number Recognition Using Knowledge Distillation and Bayesian Optimization SENSORS, 2019, v.19 no.19 , 4218-4218
Courses
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2024-1st
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Digital Image Processing
- Subject No 36515Class No 01
- 4Year ( 3Credit , 3Hour) Mon 6~6 (ENG ) , Wed 5~5 (153)
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Mathematics for System Design
- Subject No G14692Class No 01
- Year ( 3Credit , 3Hour) Tue 2~3 (ENG )
- Classroom Changed
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Smart Factory Capstone Design
- Subject No G18163Class No 01
- Year ( 3Credit , 3Hour)
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2023-2nd
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Signals & Systems
- Subject No 30272Class No 01
- 2Year ( 3Credit , 3Hour) Mon 3~3 (ENG A) , Wed 2~2 (101)
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Digital Signal Processing and Laboratory
- Subject No 34309Class No 01
- 3Year ( 3Credit , 3Hour) Mon 5~5 (ENG A107) , Wed 4~4 (ENG A410(A)) , Wed 5~5 (ENG A410()
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Smart Factory Capstone Design
- Subject No G18163Class No 01
- Year ( 3Credit , 3Hour)
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2023-1st
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Digital Image Processing
- Subject No 36515Class No 01
- 4Year ( 3Credit , 3Hour) Mon 3~3 (ENG A107) , Wed 2~2 (ENG A107)
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Smart Factory Capstone Design
- Subject No G18163Class No 01
- Year ( 3Credit , 3Hour)
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2022-2nd
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Digital Signal Processing and Laboratory
- Subject No 34309Class No 01
- 3Year ( 3Credit , 3Hour) Wed 5~5 (ENG A410(A)) , Wed 6~6 (ENG A410() , Mon 6~6 ())
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2022-1st
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Digital Image Processing
- Subject No 36515Class No 01
- 4Year ( 3Credit , 3Hour) Tue 3~3 (ENG ) , Thu 2~2 (153)
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2021-2nd
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Digital Signal Processing and Laboratory
- Subject No 34309Class No 01
- 3Year ( 3Credit , 3Hour) Mon 6~6 (ENG ) , Wed 5~5 (159) , Wed 6~6 (ENG A410(A))
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2021-1st
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Mathematics for System Design
- Subject No G14692Class No 01
- Year ( 3Credit , 3Hour) Mon 5~6 (ENG )
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Academic Background
University of Michigan Ph.D.(전기공학)